JEOL Ltd manufactures a wide range of scientific instruments.

The instrument models briefly presented here are those normally sold in Europe. Please contact us if you are interested in full brochures, other JEOL models, special solutions or just more information. 

Descriptions of our instruments are also available in English from the JEOL Global website www.jeol.com and in Japanese from JEOL Tokyo.

Electron optical instruments:

• Attachments to instruments
• Electron beam lithography (EBX)
• Electron probe microanalyzers (EPMA)
• Scanning Auger Microprobe (JAMP)
• Scanning electron microscopes (SEM)
• Scanning probe microscopes (SPM)
• Semiconductor process tools (JFS)
• Transmission electron microscopes (TEM)
• Wafer inspection scanning electron microscopes (JWS)

Instruments for chemical analysis:

• Amino acid analyzers (JLC)
• Electron spin resonace spectrometers (ESR)
• Mass spectrometers (MS)
• NMR spectrometers (NMR)
• X-ray photoelectron spectrometer(XPS or ESCA)