Apart from giving superb images at a wide range of magnifications and having powerful facilities for electron diffraction studies, these TEMs are often equipped with analytical spectrometers for X-ray analysis and in-column or post-column electron energy spectroscopy and energy filtered imaging.

The material research models of the 300 kV series can produce an intense focused beam of less than 0.5 nm size. This capability  combined with the high electron intensity achieved with a field emission gun results in a powerful system for sub-nanometer analysis and ultrahigh resolution HAADF STEM images.

All these microscopes can be equipped with a range of polepieces permitting the user to choose an optimum configuration depending on applications.

The specifications on resolution and magnification given below are all based on the high resolution versions.

	JEM-3000SFF Field emission cryo TEM
	Specifications Lattice resolution at 4.2ºK 0.2 nm Acc. Voltage  100 - 300 kV Magnification 60 - 400.000 X Stage Top entry, He cooled Emitter Thermal field emitter
	JEM-3000F Field emission TEM
	Specifications Point resolution 0.17 nm Acc. Voltage 100 - 300 kV Magnification 50 - 1,500,000 X Emitter Thermal field emitter
	JEM-3200FS Field emission energy filter TEM
	Specifications Point resolution 0.17 nm Acc. Voltage max 300 kV Magnification 100 - 1,500,000 X Emitter Thermal field emitter Spectrometer In-column filter Energy resolution 0.9 eV Energy dispersion max 220 µm/eV
	JEM-3010 High resolution TEM
	Specifications Point resolution 0.17 nm Acc. Voltage 100 - 300 kV Magnification 60 - 1,500,000 X Emitter LaB6